Cross section/broad beam ion polisher Leica EM TIC3X
Machine for polishing broad range of materialographic samples (metals, ceramics, plastics, organic species, composites of various types, porous materials) in cross-section or in planar polishing mode. Features three Ar ion guns displaced mutually by 45°, aiming at the same point, independently controllable. Three sample stages are available: one for ion milling in cross section, a rotary stage for planar polishing and a cryo stage for cross-section polishing of sensitive samples.
Publications
SUCHÝ, J.; KLAKURKOVÁ, L.; MAN, O.; REMEŠOVÁ, M.; HORYNOVÁ, M.; PALOUŠEK, D.; KOUTNÝ, D.; KRIŠTOFOVÁ, P.; VOJTĚCH, D.; ČELKO, L., 2021: Corrosion behaviour of WE43 magnesium alloy printed using selective laser melting in simulation body fluid solution. JOURNAL OF MANUFACTURING PROCESSES 69, p. 556 - 11, doi: 10.1016/j.jmapro.2021.08.006 (VERIOS, TIC3X, RIGAKU3)
ŠŤASTNÝ, P.; VACEK, P.; TRUNEC, M., 2020: Characterization of microstructure and phase distribution of sintered multiphasic calcium phosphate bioceramics. CERAMICS INTERNATIONAL 46 (4), p. 5500 - 5, doi: 10.1016/j.ceramint.2019.10.300 (TIC3X, VERIOS, RIGAKU3, TITAN, HELIOS)