Vacuum ultraviolet spectrometer McPherson VUVAS 1000

The VUVAS spectrophotometer directly measures reflectance and transmittance properties of materials in vacuum ultraviolet (VUV) range. The VUVAS system works from 120 to 380 nanometers with resolution of 0.1nm or better

Publications

Vida, J., 2019: Deposition of ternary oxides with titanium and characterization of their optical and electrical properties. MASTER'S THESIS, p. 1 - 50 (KRATOS-XPS, ALD, WOOLLAM-VIS, VUVAS, RIGAKU3, EVAPORATOR, SUSS-MA8, SUMMIT)

Ondracka, P; Holec, D; Necas, D; Kedronova, E; Elisabeth, S; Goullet, A; Zajickova, L, 2017: Optical properties of TixSi1-xO2 solid solutions. PHYSICAL REVIEW B 95 (19), doi: 10.1103/PhysRevB.95.195163 (VUVAS, RIGAKU3)

Gallery

Details

Type of access
Full-service (paid), Self-service
Research area
Characterization
Guarantor
Nebojsa, Alois
Site
CEITECNANO
Location
CEITEC Nano - C1.21

Documents

List of Experienced Users in Optical Lab C1.21
VUVAS Guide
External Manuals & Docs